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An Organic-Photoconductive-Film CMOS Image Sensor’s Advanced Technologies – Ms. Kazuko Nishimura, Panasonic Corporation, Japan

27/07/2021 @ 11:30 - 13:00

We have developed a CMOS image sensor with an organic photoconductive film (OPF) laminated on pixel circuits, different from those of a conventional silicon image sensors, in which the organic thin film for photoelectric conversion and the charge storage part for signal charge accumulation are completely independent. In this presentation, we focus on the advantageous features of the OPF image sensor; technology that realizes over 120 dB simultaneous-capture wide dynamic range; global shutter technology achieving high saturation signals per unit square that is 10 dB higher than that of silicon image sensors with the global shutter function, without sacrificing pixel area; RGB-NIR sensor technology capable of controlling NIR sensitivity by simply controlling the voltage applied to the OPF. Moreover, we introduce about 8K4K high resolution sensor technologies with 60fps high frame rate, 450ke- high saturation signals, and the global shutter function at the same time. We believe these features of the OPF image sensor will contribute to leaps in the imaging and sensing fields.
Kazuko Nishimura received the B.E. degree in mechanical engineering from Osaka University, and joined Panasonic Corporation where she engaged in high-speed analog-to-digital converters (ADCs) in 1995. She developed optical communication systems for fiber-to-the-home (FTTH), RF tuners and CMOS image sensors. Currently, she is a manager in Technology Division (R&D Division), Panasonic Corporation and pursues research on the organic photoconductive film (OPF) CMOS image sensors and sensor applications. She serves A-SSCC data converter subcommittee chair and ISSCC Imagers, Medical, MEMS and Displays subcommittee, IEEE SSCS distinguished Lecturer, and the SSCS Adcom. She is a senior member of IEEE.
Virtual: https://events.vtools.ieee.org/m/297821

Details

Date:
27/07/2021
Time:
11:30 - 13:00
Website:
https://events.vtools.ieee.org/m/297821