Search
Close this search box.
Loading Events

« All Events

  • This event has passed.

Advances in RFIC and MMIC

02/11/2021 @ 11:00 - 13:00

Advances in RFIC and MMIC
Room: Grand B
Chair: Aleksey Dyskin (Technion – Israel Institute of Technology, Israel)
11:00 (https://edas.info/showManuscript.php?m=1570724299&ext=pdf&type=stamped)
Samuel Jameson, Nadav Buadana, Zion Eliatim, Amitay Wolfman, Isaac Sarusi and Ofer Shaham (Rafael, Israel) 11:30 (https://edas.info/showManuscript.php?m=1570725575&ext=pdf&type=stamped)
Fabian Binde, Maximilian Hollenbach and Gleb Manokhin (OVGU – Die Otto-von-Guericke-Universität Magdeburg, Germany); Vadim Issakov (Technische Universität Braunschweig, Germany) 11:50 (https://edas.info/showManuscript.php?m=1570734945&ext=pdf&type=stamped)
Vincent Lammert (Infineon Technologies AG/Friedrich-Alexander University Erlangen-Nuremberg, Germany); Paulius Sakalas (Technische Universität Dresden, Germany & Semiconductor Physics Institute, Baltic Institute of Advanced Technology, Lithuania); Andreas Werthof (Infineon Technologies AG, Germany); Robert Weigel (Friedrich-Alexander Universität Erlangen-Nürnberg, Germany); Vadim Issakov (Infineon Technologies AG, Germany) 12:10 (https://edas.info/showManuscript.php?m=1570735493&ext=pdf&type=stamped)
Hendrik Magnus Lehmann (Infineon Technologies AG & TU Braunschweig, Germany); Julian Hille (Infineon Technologies AG / TU Munich, Germany); Cyprian Grassmann (Infineon, Germany); Vadim Issakov (Technische Universität Braunschweig, Germany) 12:30 (https://edas.info/showManuscript.php?m=1570741312&ext=pdf&type=stamped)
Evelyne Kaule (Brandenburg University of Technology Cottbus-Senftenberg, Germany); Peng Luo (Chengdu Danxi Technology Co., China); Cristina Andrei (Brandenburg University of Technology Cottbus-Senftenberg, Germany); Serguei Chevtchenko (Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Germany); Matthias Rudolph (Brandenburg University of Technology, Germany)
Tel Aviv, Tel Aviv District, Israel, Virtual: https://events.vtools.ieee.org/m/299146